Testing to AES17 standards

Linked Resources:

APPLICATION NOTES

AD and DA Converter Testing

Digital Interface Testing (AES3 AES/EBU S/PDIF)

HELP FILES

dScope Series III AES17 Application Help Manual

MANUALS

dScope Series III Applications Manual (A4 format)

RELEVANT PRODUCTS

VSIO Adapter

dScope Series III

The dScope Series III is shipped with a suite of tests which automate the “AES17 standard” specification which apply to any device utilising sampling in its audio chain. This applies particularly to devices where the aim of the equipment is to preserve the integrity of the signal (e.g. A/D or D/A converters), rather than to modify it (e.g., reverberators, pitch shifters etc.).

The dScope AES17 application consists of a menu-driven suite of over 30 tests arranged into the same six groups as the AES standard (“input characteristics”, “output characteristics”, “linear response” etc.). These tests are written in VBScript, which is a standard Windows language used by the dScope as its automation language. The AES17 application is included in the standard dScope installation and is available from the “Applications” button on the user bar.

The menus are dynamically configured to present only the applicable tests depending on whether the device under test has digital or analogue inputs and outputs. Help is available for each test, describing the applicability, the aim and the methodology. The tests have followed the AES standard carefully in the method and presentation of results. Automation makes tests that would otherwise be very time-consuming and laborious as easy as clicking a button on a menu.

The below table lists the tests specified in the AES17 test regime

A-A characteristics	A-D characteristics	D-A characteristics	D-D characteristics
Input characteristics Alias suppression Overload Input level for full-scale amplitude Maximum input amplitude Gain stability	Input characteristics Alias suppression Overload Input level for full-scale amplitude Maximum input amplitude Gain stability A/D jitter susceptibility	Input characteristics Digital input format D/A jitter susceptibility	Input characteristics Digital input format D/A jitter susceptibility
Output characteristics Out-of-band components Image suppression Output amplitude at full-scale Maximum output amplitude System Level stability	Output characteristics Digital output format	Output characteristics Out-of-band components Image suppression Output amplitude at full-scale Maximum output amplitude System Level stability	Output characteristics Digital output format
Linear Response Frequency response Maximum signal level vs frequency Phase Response^* Group Delay^* Inter-channel phase response Polarity Delay through device	Linear Response Frequency response Maximum signal level vs frequency Phase Response^* Group Delay^* Inter-channel phase response Polarity Delay through device^*	Linear Response Frequency response Maximum signal level vs frequency Phase Response^* Group Delay^* Inter-channel phase response Polarity Delay through device^*	Linear Response Frequency response Maximum signal level vs frequency Phase Response^* Group Delay^* Inter-channel phase response Polarity Delay through device
Amplitude non-linearity Level-dependent logarithmic gain Intermodulation Signal modulation noise Low-level noise modulation THD+N vs frequency THD+N vs level	Amplitude non-linearity Level-dependent logarithmic gain Intermodulation Signal modulation noise Low-level noise modulation THD+N vs frequency THD+N vs level	Amplitude non-linearity Level-dependent logarithmic gain Intermodulation Signal modulation noise Low-level noise modulation THD+N vs frequency THD+N vs level	Amplitude non-linearity Level-dependent logarithmic gain Intermodulation Signal modulation noise Low-level noise modulation THD+N vs frequency THD+N vs level
Signal-to-Noise Idle channel noise Idle channel noise spectrum Signal-to-Noise Ratio (SNR) Power-line (mains) related products	Signal-to-Noise Idle channel noise Idle channel noise spectrum Signal-to-Noise Ratio (SNR) Power-line (mains) related products	Signal-to-Noise Idle channel noise Idle channel noise spectrum Signal-to-Noise Ratio (SNR) Power-line (mains) related products	Signal-to-Noise Idle channel noise Idle channel noise spectrum Signal-to-Noise Ratio (SNR) Power-line (mains) related products
Cross-talk & separation Inter-channel cross-talk & separation Non-linear inter-channel cross-talk Input-to-output leakage	Cross-talk & separation Inter-channel cross-talk & separation Non-linear inter-channel cross-talk Input-to-output leakage	Cross-talk & separation Inter-channel cross-talk & separation Non-linear inter-channel cross-talk Input-to-output leakage	Cross-talk & separation Inter-channel cross-talk & separation Non-linear inter-channel cross-talk Input-to-output leakage

^*Asterisked tests are not currently implemented in the dScope AES17 application

For more information, go to the downloads page and download the dScope Applications manual. The Applications help file is included in the standard dScope installation. For any further help or questions, please contact us using the form below:

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App ID: 0009, Resource ID: 80